Role Overview
We are seeking an experienced PIC Test Engineer with deep expertise in both wafer-level and die-level optical and electrical test for Photonic Integrated Circuits (PICs).
This role will own the test strategy and execution across the full product lifecycle—from early silicon bring-up through high-volume manufacturing (HVM).
The ideal candidate is a recognized technical authority in test architecture, PIC Design-for-Test (DFT), yield learning, and factory scalability, with proven leadership in driving robust test solutions across multiple technology nodes and product families.
Key Responsibilities-
Wafer-Level Test Strategy & Architecture
Define and own the wafer-level PIC test roadmap across multiple product lines and technology platforms.
Architect scalable, high-throughput optical + electrical wafer probe solutions, balancing alignment accuracy, probe stability, and test time.
Establish release criteria, guard-banding strategy, and wafer test coverage models aligned with product requirements.
Die-Level Testing
Define and own tests not carried out at wafer level. Examples include Optical Vector Analysis (OVA) testing, and polariazation-resolved testing.
First Silicon Bring-Up & Test Content Development
Lead first-silicon bring-up efforts, including test content definition, limit setting, and characterization flows.
Drive rapid yield-learning loops in partnership with design, process integration, and fabrication teams.
Enable fast debug and iteration during early node transitions and new platform ramps.
DFT & PDK Collaboration
Influence PIC Design-for-Test features and PDK structures to improve wafer-level Scalability, Including
- On-chip monitors
- Loopback paths
- Test waveguides
- Calibration structures
Partner with design teams to embed manufacturable test hooks early in the development cycle.
Yield Ownership & Data-Driven Analysis
Own wafer-level yield, parametric distributions, and systematic defect learning.
Perform advanced spatial analytics using wafer maps and statistical methods to separate random vs systematic process issues.
Lead root-cause investigations related to lithography bias and process drift.
Manufacturing Readiness & Factory Scale-Up
Establish golden wafer / golden die methodologies for production stability and tool correlation.
Partner with foundries and OSATs to qualify wafer-level optical probe infrastructure.
Drive successful transfer of test flows into volume manufacturing environments with strong cross-tool correlation.
Technical Leadership & Team Development
Serve as the technical escalation point during yield crises and manufacturing transitions.
Mentor and develop junior engineers, setting engineering standards and best practices across wafer-level test programs.
Multiply organizational impact through scalable infrastructure, DFT influence, and test standardization.
Qualifications
Required
10+ years of experience in PIC test engineering, wafer-level probing, or photonics manufacturing test.
Proven ownership of wafer-level optical/electrical test strategy from R&D through HVM.
Expertise In
- Wafer-level optical probing
- Die-level test development. For example: characterization of polarization splitter-rotators and characterization of component backreflection.
- Probe card qualification
- Yield learning and spatial analysis
- Test time optimization
- Foundry engagement and factory transfer
Preferred
Experience with high-speed optical and electrical testing of photonic integrated circuits or optical transceivers.
Experience specifically with silicon photonics PICs, testing over a broad wavelength range.
Experience influencing PIC DFT and collaborating closely with PDK development teams.
Strong background in high-volume semiconductor or photonics manufacturing ecosystems.
Demonstrated leadership in scaling test infrastructure across multiple nodes and product families.
#J-18808-LjbffrSenior / Principal PIC Test Engineer in santa clara at Unknown Company
This position is listed as full time and onsite.