Applied Optoelectronics, Inc. (AOI) seeks a Senior Electron Microscopy Engineer to drive advanced microscopy for semiconductor laser failure analysis and yield improvement.
The candidate will lead expert analyses using FIB, SEM, EDX/EDS, TEM/STEM, HRTEM, and electron diffraction, with emphasis on defect formation and process origins. The role requires deep crystallography knowledge, hands-on FIB sample prep, and the ability to connect microscopy observations to device performance and
#J-18808-LjbffrSenior Electron Microscopy Engineer: Defect & FIB/TEM Expert in tx at Unknown Company
This position is listed as full time and onsite.