Friedrich-Alexander University Erlangen-Nurnberg invites applications for a 36-month PhD position focused on metrology at wafer level, characterizing 3C-SiCOI stacks. This role is part of the SiCPIC network and includes mandatory international secondments and training across Europe.
The project will be hosted in FAU's Crystal Growth Lab, with the supervisor Professor Peter Wellmann. Candidates should hold a master in materials science or related fields and have good English communication skills.
#J-18808-LjbffrPhD in Wafer-Level Metrology for SiC Photonics in remote at Unknown Company
This position is listed as full time and onsite.